Electron Microscopy – UBC EM

Both scanning electron microscopy  (SEM) and transmission electron microscopy (TEM) provide the ability to examine small, subatomic particles or compositions of a sample. Whereas SEM focuses on the samples surface, TEM provides insight into what is inside or beyond the surface of a sample.

Key capabilities

SEM
  • Energy dispersive x-ray (EDX) analysis for qualitative and quantitative compositional analysis
  • High resolution imaging at the nano scale
  • Electron backscatter diffraction (EBSD)/orientation imaging
  • Focused ion beam (FIB) milling for TEM sample preparation or direct analysis
  • Full cryogenic sample preparation and analysis
TEM
  • Atomic resolution single-particle 3D reconstruction
  • EM tomography for 3D information at the nano scale
  • Full cryogenic sample preparation and analysis
  • High-resolution imaging for biological and non-biological samples
  • Selected area diffraction for phase analysis
  • Direct electron detector

Equipment List

Scanning Electron Microscopes:

Hitachi SU8700 SEM
FEI Quanta 650 
Hitachi SU3500

Hitachi SU3900 SEM
Thermo Fisher Apreo ChemiSEM
Tescan MIRA

(Scanning Electron) Microprobe Analysis:

JEOL JXA-iHP 200F Field Emission Electron Microprobe

Focused Ion Beam – Scanning Electron Microscopes:

Zeiss XB350 FIB-SEM
FEI Helios 650 Nanolab
TESCAN AMBER-X pFIB-SEM

Transmission Electron Microscopes:

FEI Tecnai Spirit 120kV TEM
FEI Tecnai G20 200kV TEM
FEI Titan Krios electron microscope
Glacios electon microscope
Talos electron microscope

Pricing

The following rates are for commercial clients. Academic rates are available through the individual labs.

  • Rates for equipment are based on “unassisted use”.
  • Technical assistance is billed at $120 per hour
  • For “assisted use” rates please add the hourly rate for technical assistance to the hourly rate for the equipment.
  • Overnight and weekend rates for unsupervised use of equipment may apply. Typically, these are 50% of regular rates.
  • Sample preparation fees vary for different equipment and processes. Please contact our individual labs for specific rates.
Electron Microscope subcategoryEquipmentPricing/hrLocation
VPSEMHitachi SU8700120
Bio-Imaging Facility
Hitachi SU350091.25Centre for High-Throughput Phenogenomics
Hitachi S3000N with EDX100Materials Engineering Electron Microscopy Lab
FESEMZeiss XB350120Bio-Imaging Facility
Zeiss XB350 - Cryo960/dayBio-Imaging Facility
FEI Helios NanoLab 650 dual beam - Electron Beam Imaging130.00Centre for High-Throughput Phenogenomics
FEI Helios NanoLab 650 dual beam - Focused Ion Beam, EDX, EBSD, STEM, Cryo157.50Centre for High-Throughput Phenogenomics
TF Apreo ChemiSEM, with EBSD, EDX130Materials Engineering Electron Microscopy Lab
TESCAN AMBER-X, Xenon pFIB-SEM, with EBSD, EDX, STEM180Materials Engineering Electron Microscopy Lab
TESCAN MIRA110Materials Engineering Electron Microscopy Lab
SEMHitachi SU3900 with EDX &CL100Electron Microbeam & X-Ray Diffraction Facility
Electron MicroprobeJEOL JXA-iHP200F EPMA200Electron Microbeam & X-Ray Diffraction Facility
TEMFEI Tecnai Spirit 120kV120Bio-Imaging Facility
FEI Tecnai G20 200kV180Bio-Imaging Facility
FEI Tecnai G20 - Cryo1,200/dayBio-Imaging Facility
FEI Titan Krioscontact ceatk@mail.ubc.caHigh Resolution Macromolecular Cryo-Electron Microscopy
Glacioscontact ceatk@mail.ubc.caHigh Resolution Macromolecular Cryo-Electron Microscopy
TEM suppliesTEM grid box37.50 each
TEM grid staining37 each
TEM grids - vial120 each
TEM grids formwar coated9 each
TEM grids Formvar/Carbon18 each
TEM grids SiO25 each

Enquire about working with us