Both scanning electron microscopy (SEM) and transmission electron microscopy (TEM) provide the ability to examine small, subatomic particles or compositions of a sample. Whereas SEM focuses on the samples surface, TEM provides insight into what is inside or beyond the surface of a sample.
Key capabilities
SEM
- Energy dispersive x-ray analysis for qualitative and quantitative compositional analysis
- High resolution imaging at the nano scale
- Electron backscatter diffraction/orientation imaging
- Focused ion beam milling for TEM sample preparation or direct analysis
- Full cryogenic sample preparation and analysis
TEM
- Atomic resolution single-particle 3D reconstruction
- EM tomography for 3D information at the nano scale
- Full cryogenic sample preparation and analysis
- High-resolution imaging for biological and non-biological samples
- Selected area diffraction for phase analysis
- Direct electron detector
Equipment List
Hitachi S2600N
Hitachi S3000N
FEI Quanta 650
Hitachi SU3500
Hitachi S4700
FEI Helios 650 Nanolab
FEI Titan Krios electron microscope
Falcon III direct electron detector
Cameca SX50 Electron Microprobe
Phillips XL30
Pricing
The following rates are for commercial clients. Academic rates are available through the individual labs.
- Rates for equipment are based on “unassisted use”.
- Technical assistance is billed at $120 per hour
- For “assisted use” rates please add the hourly rate for technical assistance to the hourly rate for the equipment.
- Overnight and weekend rates for unsupervised use of equipment may apply. Typically, these are 50% of regular rates.
- Sample preparation fees vary for different equipment and processes. Please contact our individual labs for specific rates.
Electron Microscope subcategory | Equipment | Pricing/hr |
---|---|---|
VPSEM | Hitachi S2600N | 70 |
Hitachi SU3500 | 87.50 | |
Hitachi S3000N with EDX | 100 | |
FESEM | Hitachi S4700 | 120 |
Hitachi S4700 - Cryo | 960/day | |
FEI Helios NanoLab 650 dual beam - Electron Beam Imaging | 125 | |
FEI Helios NanoLab 650 dual beam - Focused Ion Beam, EDX, EBSD, STEM, Cryo | 150 | |
SEM | Phillips XL30 with EDX | 60 |
Electron Microprobe | Cameca SX50 | 140 |
TEM | Hitachi H7600 | 120 |
FEI Tecnai G2 | 180 | |
FEI Tecnai G2 - Cryo | 1,200/day | |
FEI Titan Krios | TBC | |
TEM supplies | TEM grid box | 37.50 each |
TEM grid staining | 37 each | |
TEM grids - vial | 120 each | |
TEM grids formwar coated | 9 each | |
TEM grids Formvar/Carbon | 18 each | |
TEM grids SiO | 25 each | |