Electron Microscopy – UBC EM

Both scanning electron microscopy  (SEM) and transmission electron microscopy (TEM) provide the ability to examine small, subatomic particles or compositions of a sample. Whereas SEM focuses on the samples surface, TEM provides insight into what is inside or beyond the surface of a sample.

Key capabilities

SEM

• Energy dispersive x-ray analysis for qualitative and quantitative compositional analysis
• High resolution imaging at the nano scale
• Electron backscatter diffraction/orientation imaging
• Focused ion beam (FIB) milling for TEM sample preparation or direct analysis
• Full cryogenic sample preparation and analysis

TEM

• Atomic resolution single-particle 3D reconstruction
• EM tomography for 3D information at the nano scale
• Full cryogenic sample preparation and analysis
• High-resolution imaging for biological and non-biological samples
• Selected area diffraction for phase analysis
• Direct electron detector

Equipment List

Hitachi S2600N SEM
Hitachi S3000N 
FEI Quanta 650 
Hitachi SU3500
Zeiss XB350 FIB-SEM
FEI Helios 650 Nanolab
FEI Tecnai Spirit 120kV TEM
FEI Tecnai G20 200kV TEM
FEI Titan Krios electron microscope
Glacios electon microscope
Talos electron microscope
Cameca SX50 Electron Microprobe
Phillips XL30

Pricing

The following rates are for commercial clients. Academic rates are available through the individual labs.

• Rates for equipment are based on “unassisted use”.
• Technical assistance is billed at $120 per hour
• For “assisted use” rates please add the hourly rate for technical assistance to the hourly rate for the equipment.
• Overnight and weekend rates for unsupervised use of equipment may apply. Typically, these are 50% of regular rates.
• Sample preparation fees vary for different equipment and processes. Please contact our individual labs for specific rates.

Enquire about working with us