Both scanning electron microscopy (SEM) and transmission electron microscopy (TEM) provide the ability to examine small, subatomic particles or compositions of a sample. Whereas SEM focuses on the samples surface, TEM provides insight into what is inside or beyond the surface of a sample.
Key capabilities
SEM
- Energy dispersive x-ray analysis for qualitative and quantitative compositional analysis
- High resolution imaging at the nano scale
- Electron backscatter diffraction/orientation imaging
- Focused ion beam (FIB) milling for TEM sample preparation or direct analysis
- Full cryogenic sample preparation and analysis
TEM
- Atomic resolution single-particle 3D reconstruction
- EM tomography for 3D information at the nano scale
- Full cryogenic sample preparation and analysis
- High-resolution imaging for biological and non-biological samples
- Selected area diffraction for phase analysis
- Direct electron detector
Equipment List
Hitachi S2600N SEM
Hitachi S3000N
FEI Quanta 650
Hitachi SU3500
Zeiss XB350 FIB-SEM
FEI Helios 650 Nanolab
FEI Tecnai Spirit 120kV TEM
FEI Tecnai G20 200kV TEM
FEI Titan Krios electron microscope
Glacios electon microscope
Talos electron microscope
JEOL JXA-iHP 200F Field Emission Electron Microprobe
Hitachi SU3900 SEM
Pricing
The following rates are for commercial clients. Academic rates are available through the individual labs.
- Rates for equipment are based on “unassisted use”.
- Technical assistance is billed at $120 per hour
- For “assisted use” rates please add the hourly rate for technical assistance to the hourly rate for the equipment.
- Overnight and weekend rates for unsupervised use of equipment may apply. Typically, these are 50% of regular rates.
- Sample preparation fees vary for different equipment and processes. Please contact our individual labs for specific rates.
Electron Microscope subcategory | Equipment | Pricing/hr |
---|---|---|
VPSEM | Hitachi S2600N | 70 |
Hitachi SU3500 | 88.75 | |
Hitachi S3000N with EDX | 100 | |
FESEM | Zeiss XB350 | 120 |
Zeiss XB350 - Cryo | 960/day | |
FEI Helios NanoLab 650 dual beam - Electron Beam Imaging | 126.88 | |
FEI Helios NanoLab 650 dual beam - Focused Ion Beam, EDX, EBSD, STEM, Cryo | 152.50 | |
SEM | Hitachi SU3900 with EDX &CL | 100 |
Electron Microprobe | JEOL JXA-iHP200F EPMA | 200 |
TEM | FEI Tecnai Spirit 120kV | 120 |
FEI Tecnai G20 200kV | 180 | |
FEI Tecnai G20 - Cryo | 1,200/day | |
FEI Titan Krios | 1000/day | |
Glacios | 300/screening | |
TEM supplies | TEM grid box | 37.50 each |
TEM grid staining | 37 each | |
TEM grids - vial | 120 each | |
TEM grids formwar coated | 9 each | |
TEM grids Formvar/Carbon | 18 each | |
TEM grids SiO | 25 each |