Electron Microscopy – UBC EM

Both scanning electron microscopy  (SEM) and transmission electron microscopy (TEM) provide the ability to examine small, subatomic particles or compositions of a sample. Whereas SEM focuses on the samples surface, TEM provides insight into what is inside or beyond the surface of a sample.

Key capabilities

SEM

• Energy dispersive x-ray analysis for qualitative and quantitative compositional analysis
• High resolution imaging at the nano scale
• Electron backscatter diffraction/orientation imaging
• Focused ion beam (FIB) milling for TEM sample preparation or direct analysis
• Full cryogenic sample preparation and analysis

TEM

• Atomic resolution single-particle 3D reconstruction
• EM tomography for 3D information at the nano scale
• Full cryogenic sample preparation and analysis
• High-resolution imaging for biological and non-biological samples
• Selected area diffraction for phase analysis
• Direct electron detector

Equipment List

Hitachi S2600N SEM
Hitachi S3000N 
FEI Quanta 650 
Hitachi SU3500
Zeiss XB350 FIB-SEM
FEI Helios 650 Nanolab
FEI Tecnai Spirit 120kV TEM
FEI Tecnai G20 200kV TEM
FEI Titan Krios electron microscope
Glacios electon microscope
Talos electron microscope
JEOL JXA-iHP 200F Field Emission Electron Microprobe
Hitachi SU3900 SEM

Pricing

The following rates are for commercial clients. Academic rates are available through the individual labs.

• Rates for equipment are based on “unassisted use”.
• Technical assistance is billed at $120 per hour
• For “assisted use” rates please add the hourly rate for technical assistance to the hourly rate for the equipment.
• Overnight and weekend rates for unsupervised use of equipment may apply. Typically, these are 50% of regular rates.
• Sample preparation fees vary for different equipment and processes. Please contact our individual labs for specific rates.

Enquire about working with us